Article Details

Title · Authors · Abstract · Keywords · DOI · References

Research on Paper Defect Detection Model Based on Improved YOLOv5

WEN Zhaofa, MEN Wenhua, HUANG Wenbo, WANG Yongqiang, ZHANG Bo

(Baoji Vocational and Technology College, Baoji 721013, China)

Section:Artificial Intelligence · Vol. 2026, Issue 10 · Pages:52-56 · 2096-4706(2026)10-0052-05 · CLC number:TP391.4 · Document code:A · DOI:10.19850/j.cnki.2096-4706.2026.10.009

Abstract

Paper defect detection is a key step in ensuring product quality in the industrial production of paper. Traditional paper defect detection methods rely on manual visual inspection and simple machine vision, which suffer from low detection accuracy, large model size and poor ability to capture small targets. Therefore, this paper proposes a paper defect detection algorithm based on improved YOLOv5. Firstly, the cosine annealing strategy is adopted for periodic dynamic adjustment of the learning rate, which effectively improves the convergence speed and convergence accuracy of the model. Secondly, the ECA attention mechanism is embedded into the backbone network to strengthen the network's ability to focus on and extract key features of paper defects, and improve the detection effect of small targets and weak texture defects. Finally, the optimizer is improved to further enhance the overall performance of the algorithm. The proposed algorithm achieves an mAP@0.5 of 94.39%, an F1-Score of 0.88 and a Recall of 80.56%, with a model size of only 27.1 MB. Compared with the original YOLOv5, its mAP@0.5, Recall and F1-Score are increased by 5.18 percentage points, 18.75 percentage points and 0.12 respectively. Compared with the model without the ECA attention mechanism, its mAP@0.5 and Recall are improved by 0.59 percentage points and 0.35 percentage points. Compared with the SGD optimizer, its mAP@0.5, Recall and F1-Score are raised by 3.83 percentage points, 14.59 percentage points and 0.09 respectively. Experimental results show that the improved YOLOv5-based paper defect detection model can provide a reference for subsequent related research.

Keywords

defect detection; ECA attention; cosine annealing; optimizer

References

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Funding

Project of Baoji Vocational and Technical College (2024250Y)

About the authors

Wen Zhaofa (1996-), male, Han ethnicity, from Baoji, Shaanxi Province, teaching assistant, master's degree, research direction: computer vision.