Copper Strip Surface Defect Detection Method Based on Improved RT-DETR
(School of Artificial Intelligence, Hubei University of Automotive Technology, Shiyan 442002, China)
Abstract
To address the issues of limited detection accuracy and insufficient feature representation capability under complex textured backgrounds in copper strip surface defect detection, a lightweight detection method based on the improved RT-DETR is proposed. By comparing different backbone networks, RT-DETR-R18, which has fewer parameters and lower computational cost, is selected as the base structure. In the backbone network, a Wide-Deep Dual-Branch (WDBB) module is introduced to enhance multi-scale feature extraction capability, and the global self-attention in the AIFI module is replaced with a deformable attention mechanism (DAttention) to guide the network to adaptively focus on high-value sampling areas, improving feature interaction and defect discrimination. Experimental results show that the improved model achieves precision, recall, and mAP@0.5 of 96.10%, 95.19%, and 97.60%, respectively, with overall performance better than that of the original model, demonstrating the effectiveness of this method in copper strip surface defect detection tasks.
Keywords
strip surface defect; RT-DETR; multi-branch structure; Attention Mechanism; detection method
References
- [1] Gu Yingkui, Ye Biaobiao, Guo Mingjian, etc Rapid detection of appearance defects in biscuit packaging based on improved RT-DETR [J]. Food and Machinery, 2025, 41 (2): 234-241
- [2] Zhang Jingwen, Sun Jian, Xu Hongwei, etc Glass insulator defect detection algorithm based on improved RT-DETR [J]. Electronic Measurement Technology, 2025, 48 (14): 96-105
- [3] Wang Liang, Ouyang Basheng A USB-C connector appearance inspection model based on improved RT-DETR [J]. Automation and Instrumentation, 2025, 40 (1): 36-42
- [4] Hu Jiwen, Zhang Guoliang, Shen Mingzhe, etc Improved RT-DETR model for surface defect detection of pine wood [J]. Journal of Agricultural Engineering, 2024, 40 (7): 210-218
- [5] Liu Yameng, Zhao Youquan, Sun Zhentao, etc Constructing an Improved RT-DETR Algorithm for Detecting Circular Ripple Defects in Contact Lenses [J]. Journal of Electronic Measurement and Instrumentation, 2024, 38 (5): 1-9
- [6] Zhou Dehui, Zhao Jun, Cheng Jinfeng Detection Algorithm for Minor Defects on Bearing Surface Based on RT-DETR [J]. Computer Applications, 2025, 45 (6): 1987-1997
- [7] Zhao Y,Lyu W Y,Xu S L,et al. DETRs Beat YOLOs on Real-Time Object Detection [C]//Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition,2024:16965-16974.
- [8] He K M,Zhang X Y,Ren S Q,et al. Deep Residual Learning for Image Recognition [C]//2016 IEEE Conference on Computer Vision and Pattern Recognition(CVPR),2016:770-778.
- [9] Wan D H,Lu R S,Hu B T,et al. YOLO-MIF: Improved YOLOv8 With Multi-Information Fusion for Object Detection in Gray-Scale Images [J/OL].Advanced Engineering Informatics,2024,62:102709.https://doi.org/10.1016/j.aei.2024.102709.
- [10] Xia Z F,Pan X R,Song S J,et al. Vision Transformer With Deformable Attention [C]//2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022:4784-4793.
- [11] Zhang Wei, Cai Yufan, Ye Lintao, etc Real time Transformer Small Object Detection Model Based on Feature Extraction Enhancement and Pyramid Structure [J]. Computer Science, 2025, 52 (S2): 375-385
- [12] Wang C Y,Bochkovskiy A,Liao H Y M. YOLOv7: Trainable Bag-of-Freebies Sets New State-of-the-Art for Real-Time Object Detectors [C]//Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition,2023:7464-7475.
- [13] Varghese R J,Sambath M. YOLOv8: A Novel Object Detection Algorithm With Enhanced Performance and Robustness [C]//2024 International Conference on Advances in Data Engineering and Intelligent Computing Systems (ADICS),2024:1-6.
- [14] Khanam R,Hussain M. YOLOv11: An Overview of the Key Architectural Enhancements [PP/OL].(2024-10-23).https://arxiv.org/abs/2410.17725.
Funding
Collaborative Education Project of the Ministry of Education (202101355003)
About the authors
Chen Long (1996-), male, Han ethnicity, from Hubei Xiaoren, is currently pursuing a master's degree in computer vision; Corresponding author: Li Xuebing (1970-), male, Han nationality, from Liuyang, Hunan, associate professor, master's student, research direction: computer vision, enterprise informatization.