DEW-YOLO: PCB Defect Detection Algorithm
(Shenyang University of Chemical Technology, Shenyang 110142, China)
Abstract
To address the various defects (such as open circuits, short circuits, missing vias, burrs, and copper leakage) that are prone to occur during the production of PCBs with increasingly complex manufacturing processes, as well as the problems of low detection accuracy for small defects, complex models, and high computational cost, this study proposes an improved detection algorithm based on YOLOv11, named DEW-YOLO. The algorithm utilizes multi-scale features to provide richer and more stable representations and employs an EMA attention module to handle complex background interference and small target recognition. Finally, the CIoU loss function is replaced with the WIoU loss function to capture the feature information more fully, thereby effectively enhancing the overall detection performance and improving the detection of low-quality small targets. Testing shows that the DEW-YOLO model achieves an mAP of 93.8% in PCB defect detection, a 4.9% improvement over YOLOv11, achieving the best performance among similar algorithms.
Keywords
PCB; YOLOv11; EMA attention; target detection
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About the authors
Xu Sen (1975-), male, Han ethnicity, from Jinzhou, Liaoning, lecturer, doctoral degree, research interests include network security and cryptography, security protocol design and analysis and wireless network protocols; Xiao Bingyao (2000-), female, Han ethnicity, from Anshan, Liaoning, postgraduate student, research interests include deep learning and machine learning; Corresponding author: Zhao Yang (1974-), male, Hui ethnicity, from Shenyang, Liaoning, lecturer, doctoral degree, research interests include deep learning, pattern recognition and image processing.